Publications
- V.I.Kolobov and R.R.Arslanbekov, "Simulation of Electron Kinetics
in Gas Discharges", IEEE Trans. Plasma. Sci. 34, 895 (2006)
- V.I. Kolobov. "Fokker Planck modeling of electron kinetics in
plasmas and semiconductors", Computational Materials Science 28,
302 (2003).
- V.I.Kolobov, "Anomalous Skin Effect in Bounded Systems",
in NATO ASI: "Electron Kinetics in Glow Discharges", Eds.
U.Kortshagen and L.D.Tsendin (Plenum Publishing) 1998
- V.I.Kolobov and V. A. Godyak , "Non-Local Electron Kinetics in
Collisional Gas Discharge Plasmas", IEEE Transactions on Plasma
Science 23, 503 (1995)
Original Journal Articles
- R.R.Arslanbekov and V.I.Kolobov, 2-D Simulations of striations in
direct current glow discharges in Argon, IEEE Trans. Plasma Sci. 33,
354 (2005)
- E.A.Bogdanov, A.A.Kudryavtsev, R.R.Arslanbekov, and V.I. Kolobov,
Simulation of pulsed dielectric barrier discharge excimer lamp, J. Phys.
D. 37, 2987 (2005)
- R.R. Arslanbekov and V.I. Kolobov, Nonmonotonic excitation rates
in argon positive column, Applied Physics Letters 85, 3396 (2004)
- R.R. Arslanbekov and V.I. Kolobov, "Two-dimensional simulations of
the transition from Townsend to glow discharge and subnormal oscillations",
Journal of Physics D 36, 2986 (2003).
- C.G.Wilson, Y.B.Gianchandani, R.R.Arslanbekov,V.I.Kolobov, and A.E.Wendt,
"Profiling and modeling of dc nitrogen microplasmas", J. Applied Physics
94, 2845 (2003)
- E.A.Bogdanov, V.I.Kolobov, A.A.Kudryavtsev, and L.D.Tsendin "Scaling
Laws for Oxygen Discharge Plasmas", Technical Physics 47, 946 (2002)
- V. Vasenkov and M. J. Kushner, Electron energy distributions and
anomalous skin depth effects in high plasma density inductively coupled
discharges, Phys. Rev. E 66, 066411 (2002).
- V.A.Godyak, B.M. Alexandrovich and V.I.Kolobov, "Lorentz force effects
on the electron energy distributions in Inductively Coupled Plasmas",
Physical Review E 64, 26406 (2001)
- R. R. Arslanbekov, Model of the cathode region and gas temperature
of a dc glow discharge at high current density, J. Phys. D: Appl. Phys.
33, 524 (2000).
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